Rapid screening of wood and leaf tissues: investigating silicon-based phytoliths in Populus trichocarpa for carbon storage applications using laser-induced breakdown spectroscopy and scanning electron microscopy–energy dispersive X-ray spectroscopy

文献情報

出版日 2023-10-04
DOI 10.1039/D3JA00186E
インパクトファクター 4.023
著者

Hunter B. Andrews, Ann M. Wymore, Elizabeth M. Herndon, Samir A. Martin, Natalie A. Griffiths, Xiaohan Yang, Wellington Muchero, David J. Weston, Madhavi Z. Martin



要旨

Phytoliths, which are noncrystalline particles of amorphous silica that form inside plant cells, contribute to the global carbon cycle through their ability to occlude organic carbon. The organic carbon within phytoliths is less susceptible to decomposition; thus, a better understanding of the relationship between phytolith formation and silicon levels in plant tissues may enable bioengineered species to maximize carbon capture during litter decomposition. To establish a high-throughput capability for the phenotypic characterization of phytolith formation in plants, this study used laser-induced breakdown spectroscopy (LIBS) and scanning electron microscope–energy dispersive X-ray spectroscopy (SEM–EDS) to investigate the relationship between silicon concentration, silicon distribution, and phytolith formation in Populus trichocarpa. The results demonstrated the ability to use LIBS with a standard addition approach to calibration to quantify silicon concentrations in pelletized wood and leaf plant tissues with limits of detection of 28.9 and 150 ppm, respectively. This technique enabled rapid testing to rank samples based on silicon levels to be used in genome-wide association studies or to screen samples prior to SEM–EDS testing. SEM–EDS mapping of leaves revealed that phytolith formation occurred primarily at moderate silicon concentrations, estimated as surface silicon concentrations between 0.5–6 wt%. In contrast, phytoliths were not observed at very low concentrations (<0.5 wt%) or at high concentrations (>6 wt%) where silicon was instead dispersed across the leaf. Additionally, phytolith size distributions could be quantified using image analyses of silicon maps derived from SEM–EDS. Neither LIBS nor SEM–EDS results indicated a significant relationship between the silicon levels in the leaves and high- and low-silicon expressing genotypes. However, silicon concentrations were strongly associated with the geographical origin of the sample, indicating that seasonality (i.e., plant phenology) or environmental factors, such as the silicon availability in soil, may play an important role in phytolith formation.

掲載誌

Journal of Analytical Atomic Spectrometry

Journal of Analytical Atomic Spectrometry
CiteScore: 6.2
自己引用率: 25.8%
年間論文数: 254

The Journal of Analytical Atomic Spectrometry (JAAS) is the central journal for publishing innovative research on fundamentals, instrumentation, and methods in the determination, speciation and isotopic analysis of (trace) elements within all fields of application. This includes, but is not restricted to, the most recent progress, developments and achievements in all forms of atomic and elemental detection, isotope ratio determination, molecular analysis, plasma-based analysis and X-ray techniques. The journal welcomes full papers, communications, technical notes, critical and tutorial review articles, editorials, and comments, in addition to the Atomic Spectrometry Updates (ASU) literature reviews that are prepared by an expert panel. Submissions are welcome in the following areas, but note this list reflects the current scope and authors are strongly encouraged to contact the Editorial team if they believe that their work offers potentially new and emerging research relevant to the journal remit: Fundamental studies in the following. New and existing sources for atomic emission, absorption, fluorescence and mass spectrometry and those that provide both atomic and molecular information Sample introduction techniques for solids, liquids, gases Improvements in sensitivity, selectivity, precision, accuracy and/or robustness Isotope ratio measurements, including techniques for improving precision and mass bias correction Single channel and multichannel simultaneous detection systems Chemometrics, statistics, calibration techniques and internal standardisation Theoretical and numerical modelling of fundamental processes related to all of the above methodologies Novel or improved methodologies in areas of application including, but not limited to the following. Biosciences, including elemental, speciation and isotopic analysis in biological systems, immunoassays based on metal-labeled antibodies, bio-imaging, and nanoparticle toxicology Geochemistry Environmental science Materials science, including engineered nanoparticles and quantum dots Metrology, including reference materials Forensic analysis Food and agricultural sciences Energy Archaeometry Molecular analysis. Molecular sources for elemental and isotopic analysis Atomic sources for molecular analysis Atomic and molecular techniques simultaneously used for complementary chemical information All contributions are judged on originality and quality of scientific content, and appropriateness of length to content of new science.

おすすめサプライヤー

中国济南信立业化工有限公司
インドサーモラブ科学機器株式会社 Ltd.
ドイツHEMA GmbH&Co.KG
ドイツ光学有限公司
スイスカーボゲン AMCIS AG
ドイツテスアップ
ドイツスタインハウス
チリプリンテック S. A.
ドイツSTRIKO Verfahrenstechnik W.Strikfeldt & Koch GmbH
中国北京エイフォーレ機電設備有限公司
免責事項
このページに表示される学術雑誌情報は、参考および研究目的のみを目的としています。当社は雑誌出版社とは提携しておらず、投稿の取り扱いも行っておりません。出版に関するお問い合わせは、各雑誌出版社に直接ご連絡ください。
表示されている情報に誤りがある場合は、[email protected] までご連絡ください。迅速に確認し、対応いたします。